Panalytical Aeris

This is an X-ray powder diffractometer for routine analysis of polycrystalline samples. It can be used for qualitative and quantitative phase analysis, crystallite/domain size determination, structure solution and refinement.

Specifications:

• Radiation: copper Kalpha 1 and 2 (1.540 and 1.544 Å)
• Reflection geometry.
• Room temperature measurements.
• Available databases: Powder Diffraction File 4+ and Crystallography Open Database.
• Analysis software: HighScore.

For more information, contact Mika Lastusaari.