X-ray powder diffractometer

Panalytical Aeris

This is an X-ray powder diffractometer for routine analysis of polycrystalline samples. It can be used for qualitative and quantitative phase analysis, crystallite/domain size determination, structure solution and refinement.


  • Radiation: copper Kalpha 1 and 2 (1.540 and 1.544 Å)
  • Reflection geometry.
  • Room temperature measurements.
  • Available databases: Powder Diffraction File 4+ and Crystallography Open Database.
  • Analysis software: HighScore.

For more information, contact Mika Lastusaari.